TI high-temperature H.E.A.T. evaluation module speeds safe testing of electronics for harsh and hot environments
Texas Instruments introduced the H.E.A.T. (harsh environment acquisition
terminal) evaluation module (EVM), the industry's first high-temperature data
acquisition system, which includes a complete set of TI signal chain components
qualified for extreme temperature operation from -55°C to 210°C.
The H.E.A.T.
EVM is test-oven ready and qualified to operate up to 200 hours at oven
temperatures of up to 200°C. It accepts eight channels of analog data and
conditions, digitizes and processes these signals for a variety of applications
in ruggedized, high-temperature environments including downhole drilling, jet
engines and heavy industrial applications.
The H.E.A.T. EVM eliminates the need for expensive up-screening and
qualification testing of industrial-grade components for temperature ranges
outside their datasheet specifications. The tool allows manufacturers to develop
applications with components qualified for harsh environments quickly and safely
and cuts development, testing and qualification time by up to one year.
For H.E.A.T. EVM details or to order, see
www.ti.com/heat-pr
201106240210.8.2011Test & measurementTexas Instruments